Separate Twin Sensor To Measure The Yarn, Roving,Sliver’s Evenness, Imperfection And Hairiness Index

Weetwo evenness tester is a computerized instrument for measuring simultaneously yarn and roving/sliver.

Two independent capacitive sensor for simultaneous testing.

Capacitive principle for mass variation and imperfection

Fault analysis software for easy identification of faults in the test material

Mass variation diagram for yarns and roving/ sliver both can be monitored simultaneously in the display at the time of testing.

TECHNICAL SPECIFICATIONS:

• Weetwo evenness tester consists of two testing units and a controller CPU.
• Two independent capacitance based sensors for measuring simultaneously yarns, roving/ sliver.
• Separate module to measure yarn hairiness index by optical method.
• User friendly software to operate both the testing units simultaneously and independently with numerical, graphical reports.
• Tests the material from 0.007NEC to 150 NEC.
• Test time can be selected from 1 to 20 minutes
• Spectrogram analysis software for easy identification of defective machine parts.
• Spectrogram and variance length (VL) curve can be obtained.

SPECIAL FEATURES:

• Two independent reliable capacitive sensors.
• Hairiness index module can be attached optionally in this instrument.
• Automatic cop changer helps to test 10 cops one by one at a time without operator’s influence(optional)
• Analysis calculation and data storage of measured values can be done by the software.
• Editor option for customizing reports.
• Testing speed: 25,50,100,200,400, mtr/min (or) yard/min.
• Number of slubs can be count in slub yarns
• Industrial grade computer for reliable operation.
• Granite table top for easy maintenance and elegant appearance.
• Self diagnosis software for easy checking of the instrument working.

REPORT PARAMETERS:

MEASURED PARAMETERS:

• U%: U Normal , U half inert , U inert.
• CV%: CVm , CV1m, CV3m , CV 50m, CV100m, CV half inert, CVinert.
• Thin: -30% , -40%, -50%, -60%.
• Thick: +35% , +50% , +70%, +100%.
• Neps: +140%, +200%, +280%, +400%.
• Imperfection
• Relative count.
• Index.
• Hairiness.
• Sh,sh(1m), sh(3m), sh(10m).
• h (max,1m), h(min,1m).

STATISTICAL REPORTS:

• Average, median, standard deviation, CV%.
• Minimum, maximum, range, 95% confidence limit and USP.

GRAPHICAL REPORT:

• Mass diagram having normal and cut length. 
• VL curve, 3D-VL-curve.
• Spectrogram, 3D- Spectrogram.
• Histogram.